Application of a Semiconductor-LDA for Inflight Measurements,
Abstract
Motivated by the need of new measuring techniques for the development of a new generation of transport aircraft incorporating a laminar wing, and LDA system for inflight measurements was developed at LSTM Erlangen. The paper reports the design and construction of the LDA and discusses alternatives to the present design. To verify the performance of the instrument, boundary layer measurements in a wind tunnel and first free flight investigations are presented. Conclusions are drawn considering further improvements of the LDA and the requirements imposed on the aircraft. The incorporation of these will ensure the application of LDA in modern aerodynamic research for laboratory and inflight studies. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 23, 1992
- Accession Number
- ADP008946
Entities
People
- F. Durst
- H. Lienhart
- Ryan Mueller