Subsurface Defect Detection in Ceramic Materials Using Low Coherence Optical Scatter Reflectometer
Abstract
We demonstrate the use of optical gating techniques for determining the size and location of subsurface defects in advanced ceramic materials. Various silicon nitride based ceramic materials are probed non-destructively using an optical gated reflectometer based on a low-coherence fiber interferometer. This device is capable of depth and lateral resolutions of 10 micrometers and 4 micrometers, respectively. Experimental results indicate that the size and position of small subsurface defects can be determined as deep as 500 micrometers below the surface.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1996
- Accession Number
- ADP010167
Entities
People
- David Lewis Iii
- J. F. Reintjes
- Manfred Kahn
- Mark Bashkansky
- Michael D. Duncan
Organizations
- United States Naval Research Laboratory