Improve Product Aperture Ratio by Controlling Magnitude of Reverse Tilt Domain

Abstract

In thin-film-transistor LCD aperture ratio is an important parameter of transmittance. In this paper, we describe the relation between aperture ratio and reverse tilt domain. We conclude that we can control the magnitude of reverse tilt domain by changing rubbing density, pile impression, cell gap and altitude of TFT. Consequently, relatively large picture ratio could be obtained by decreasing the area of black matrix.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2000
Accession Number
ADP011329

Entities

People

  • C. J. Pan
  • H. H. Wu
  • W. H. Ho

Tags

DTIC Thesaurus Topics

  • Altitude
  • Clearances
  • Electric Fields
  • Electrodes
  • Liquid Crystal Displays
  • Optical Properties
  • Technical Information Centers
  • Thin Film Transistors
  • Thin Films
  • Transistors
  • Transmittance

Readers

  • Human-Computer Interaction (HCI).
  • Materials Science and Engineering.
  • Semiconductor Device Technology