Improve Product Aperture Ratio by Controlling Magnitude of Reverse Tilt Domain
Abstract
In thin-film-transistor LCD aperture ratio is an important parameter of transmittance. In this paper, we describe the relation between aperture ratio and reverse tilt domain. We conclude that we can control the magnitude of reverse tilt domain by changing rubbing density, pile impression, cell gap and altitude of TFT. Consequently, relatively large picture ratio could be obtained by decreasing the area of black matrix.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 2000
- Accession Number
- ADP011329
Entities
People
- C. J. Pan
- H. H. Wu
- W. H. Ho