UV Irradiation Effects in Pure and Tin-Doped Amorphous AsSe Films

Abstract

Pure and tin-doped AsSe amorphous films were investigated. The changes in the MRO induced by Sn were analyzed be accurate profiling the first sharp diffraction peak (FSDP) in the X-ray diffraction diagram. A shift of FSDP as a function of tin concentration was observed. The structural changes induced by ultraviolet rays (lambda = 336 nm) for various time intervals of irradiation were revealed by small angle X-ray diffraction. It was revealed the formation of a special layer at the surface of the films, whose thickness increases during UV irradiation.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP011515

Entities

People

  • F. Sava
  • M. Lovu
  • M. Popescu
  • O. Shpotyuk
  • W. Hoyer

Organizations

  • National Insitute for Materials Physics

Tags

Communities of Interest

  • Biomedical
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Advanced Materials
  • Band Gaps
  • Diffraction
  • Films
  • Materials
  • Optical Materials
  • Periodic Variations
  • Radiation
  • Rate Of Formation
  • Scattering
  • Technical Information Centers
  • Thickness
  • Thin Films
  • Time Intervals
  • X Ray Scattering
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.