Glassy Transformation and Structural Change in Ge2Sb2Te5 Studied by Impedance Measurements

Abstract

The transition form amorphous-to-crystalline (fcc) has been investigated in Ge(2)Sb(2)Te(5) thin film alloys. This composition is the most frequently used for erasable optical memory devices. The phase transition was monitored using in situ impedance measurements as a function of temperature. The results were analyzed using the Maxwell-Wagner and brick models. From the impedance measurements it is possible to detect the appearance of nucleation centers in samples heated at temperatures below crystallization. In samples treated at temperatures above crystallization, the increase in the volume fraction of crystalline material due to the increase in the temperature is also deduced from the impedance measurements. From our investigation we have shown that impedance measurements are a sensitive method to analyze the crystallization process in chalcogenide materials.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP011521

Entities

People

  • E. Morales-sanchez
  • E. Prokhorov
  • J. Gonzalez-hernandez

Organizations

  • National University

Tags

DTIC Thesaurus Topics

  • Advanced Materials
  • Amorphous Materials
  • Capacitance
  • Crystal Structure
  • Crystallization
  • Crystals
  • Dielectric Permittivity
  • Electrical Properties
  • Films
  • Glass Transition Temperature
  • Grain Boundaries
  • Materials
  • Phase Transformations
  • Spectra
  • Thin Films
  • Transition Temperature
  • Transitions

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Microwave Engineering.