Thermally-Induced Structural Changes in Copper-Containing Chalcogenide Thin Films

Abstract

Thin-film samples of the system Cu(x)(AsSe1.4I0.2)1-x, x<l5 at%, were prepared by the method of thermal evaporation on "cold" substrates in vacuum, using a specially constructed quartz cell as evaporation chamber. The method of transmission electron microscopy was employed to follow the structural changes taking place in the course of thermal treatment of the freshly deposited film samples. It was found that the contents of selenium and copper in the starting glass have a decisive role in determining the structure and properties of the material. The observed microgranular two-phase structures of thin films have a grain size of the order of 10 nm. Heating of the samples to the softening temperature yields the structural transformation in the films from the starting amorphous phase to a new amorphous phase. Also, the temperatures were determined at which partial crystallization takes place, resulting in the separation of crystalline centers of the elemental selenium.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP011522

Entities

People

  • A. F. Petrovic
  • D. M. Petrovie
  • F. Skuban
  • N. Cvejic
  • S. R. Lukie

Organizations

  • Institute of Physics

Tags

DTIC Thesaurus Topics

  • Advanced Materials
  • Amorphous Materials
  • Diffraction
  • Electromagnetic Radiation
  • Electron Microscopy
  • Films
  • Glass
  • Mass Spectra
  • Materials
  • Microscopes
  • Microscopy
  • Optical Materials
  • Refraction
  • Softening
  • Thin Films
  • Transmission Electron Microscopy
  • X Rays

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene