Research of a Microplasma Breakdown in Thin Films of Glassy Semiconductors

Abstract

Experiments were carried out to detect presence of a microplasma in thin films of glassy chalcogenide semiconductors. Films of As2Se3 and As2SeTe2 were investigated. In the regime of a "soft" breakdown time series of current and voltage of the samples based on As2Se3 were measured and then processed by spectral analysis. Films of As2SeTe2 were used for experiment with long discharge space. This experiment resulted in observation of oscillating streamer discharge. A model was suggested to explain the phenomenon.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP011549

Entities

People

  • A. R. Fairushin

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Advanced Materials
  • Amorphous Materials
  • Charge Carriers
  • Demographic Cohorts
  • Films
  • Frequency
  • Generators
  • Hot Spots
  • Lepidoptera
  • Materials
  • Oscillation
  • Phase Diagrams
  • Power Engineering
  • Semiconductors
  • Spatial Distribution
  • Technical Information Centers
  • Thin Films

Readers

  • Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Space
  • Space - Hall-Effect Thruster