Anisotropic Electromagnetic Properties of RF Sputtered Ni-Al(2)O(3) Composite Thin Films
Abstract
Experimental data of the permittivity of RF sputtered Ni-Al(2)O(3) thin films were studied in the wavelength region from 300 to 2500 nanometers 1. The data were analyzed in the framework of the Bergman-Milton theory and it was shown that they lie inside the Hashin- Shtrikman bounds, but outside the Bergman-Milton bounds. The latter indicates a strong electromagnetic anisotropy of the composite thin film. For a more detailed theoretical study, we performed calculations using the Maxwell Garnett, Bruggeman and Incremental Maxwell Garnett homogenization formalisms for uniaxial dielectric composites 2-4. A comparison between the calculated and measured permittivities was made on the basis of a least-square fit. In this paper, we interpret the results and suggest models for the microstructures of the Ni-Al(2)O(3) thin films.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 29, 2000
- Accession Number
- ADP011646
Entities
People
- B. Michel
- T. S. Sathiaraj
Organizations
- University of Botswana