Imaging Technologies in the Millimeter Wave Region
Abstract
Imaging technologies using millimeter (mm) waves offer unique measurement means in many application areas. We discuss here mm-wave focal plane imaging technologies whose resolution is limited by diffraction and also mm-wave scanning near-field microscopy whose resolution is much smaller than operating wavelength. Results of our researches on both of these imaging technologies are presented.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 29, 2000
- Accession Number
- ADP011768
Entities
People
- Koji Mizuno
Organizations
- Tohoku University