Fabrication and Characterization of Thin Ferroelectric Interferometers for Light Modulation

Abstract

A thin ferroelectric interferometer (TFI) structure for light modulating devices is presented. It was fabricated entirely with thin film techniques on sapphire and silicon substrates. The ferroelectric layer in this structure was the lanthanum-modified lead zirconate titanate (PLZT) electrooptic material deposited from a chemical precursor solution onto an ITO-coated dielectric mirror stack. Light intensity modulation in both transmission and reflection modes and phase modulation in the reflection mode were demonstrated. Experimental and simulation data show that TFI devices can be fast switching with a low driving voltage. Variations of the basic TFI structure can be used for phase tunable spatial light modulators (SLM's) and laser beam steering devices. Design principles fabrication procedure and the preliminary performance of the devices are described.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2000
Accession Number
ADP011845

Entities

People

  • Feiling Wang
  • Jianjun Zheng
  • Kewen K. Li
  • Peter L. Pondillo

Tags

DTIC Thesaurus Topics

  • Beam Steering
  • Films
  • Interferometers
  • Laser Beams
  • Lasers
  • Light Sources
  • Materials
  • Modulation
  • Modulators
  • Optical Modulators
  • Optomechanics
  • Phase Modulation
  • Phase Modulators
  • Quantum Wells
  • Reflection
  • Thin Films
  • Transition Temperature

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Optical Physics and Photonics.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition