Mechanics of Multi Walled Carbon Nanotubes Probed by AFM

Abstract

Using the AFM tip, nanotubes are caught on a raw sample then deposited on a clean surface with an absolute precision better than 500nm. A nanostructured surface made of smooth Germanium dots on flat silicon was used as deposition sample. Nanotube mechanics is probed by AFM tip induced displacement. Nanotubes are shown to be blocked by Ge dots: it is impossible to induce a controlled displacement of the nanotube over a Ge dot when it is pushed against the dot. Elastic energy due to the bending of the nanotube is at the root of that behavior.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 2001
Accession Number
ADP012149

Entities

People

  • F. Comin
  • J. Chevrier
  • L. Patrone
  • S. Decossas

Organizations

  • Joseph Fourier University

Tags

DTIC Thesaurus Topics

  • Carbon Nanotubes
  • Chemical Vapor Deposition
  • Displacement
  • Electron Microscopy
  • Friction
  • Fullerenes
  • Materials
  • Materials Science
  • Mechanical Properties
  • Microscopes
  • Microscopy
  • Molecular Electronics
  • Nanotechnology
  • Paper
  • Scanning Electron Microscopy
  • Technical Information Centers
  • Transmission Electron Microscopy

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Structural Dynamics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene