Insight into the Formation of Ultrafine Nanostructures in Bulk Amorphous Zr(54.5)Ti(7.5)Al(10)Cu(20)Ni(8)

Abstract

Bulk amorphous Zr(54.5)Ti(7.5)Al(10)Cu(20)Ni(8) is investigated by means of small-angel neutron scattering (SANS) diffractional-scanning calorimetry (DSC) high-resolution electron microscopy (HREM) and other methods. The formation of ultrafine nonstructures in the glassy phase is observed and explained by a new model. Structural fluctuations of randomly distributed partially ordered domains grow during annealing just below the glass transition temperature by local re-ordering. During annealing the DSC gives evidence for a increasing volume fraction of the locally ordered domains. At high volume fractions of impinging domains a percolation threshold on the interconnected domain boundaries occurs and enhanced diffusion becomes possible. At that stage SANS measurements lead to statistically significant scattering data. The SANS signals are analyzed in terms of a model taking into account spherical particles surrounded by diffusion zones and interparticle interference effects. The mean radius of the nanocrystalline particles is determined to 1 nm and the mean thickness of the depletion zone is 2 nm. The upper limit for the volume fraction after annealing at 653 K for 4 hours is about 20%. Electron microscopy confirms the size and shows that the particle ant crystalline.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2001
Accession Number
ADP012202

Entities

People

  • Albrecht Wiedenmann
  • Andre Heinemann
  • Helmut Hermann
  • Norbert Mattern
  • Uta Kuhn

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Annealing
  • Chemical Composition
  • Diffusion
  • Equations
  • Heat Energy
  • Intervals
  • Materials
  • Nanocomposites
  • Nanostructures
  • Neutron Scattering
  • Particle Size
  • Particles
  • Scattering
  • Spatial Distribution
  • Spinodal Decomposition
  • Statistical Analysis
  • Technical Information Centers

Readers

  • Materials Science and Engineering.
  • Mathematics or Statistics
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics