Characterization of the Morphology of Faceted Particles by Transmission Electron Microscopy

Abstract

Faceting in a polyhedral rutile particle was modeled from transmission electron microscopy images. A double-tilt, rotate transmission electron microscope (TEM) sample holder was used to manipulate the particle. Using this holder, it was possible to align the c axis of the particle along one of the axes of the sample holder. This alignment allowed images to be obtained of the particle in several orientations around its c axis. Assuming symmetrical growth perpendicular to the c axis of the rutile particle, comparison of dimensions and angles obtained to those obtained for hypothetical models of the particle gives information about its likely prismatic and pyramidal faceting. This approach to facet modeling in combination with thickness information should be useful for more complete determination of the faceting in individual euhedral particles using transmission electron microscopy.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2001
Accession Number
ADP012209

Entities

People

  • David S. Bright
  • Shirley Turner

Organizations

  • National Institute of Standards and Technology

Tags

DTIC Thesaurus Topics

  • Commercial Equipment
  • Composite Materials
  • Crystallites
  • Electron Microscopy
  • Materials
  • Measurement
  • Microscopy
  • Nanocomposites
  • Nanomaterials
  • Orientation (Direction)
  • Particles
  • Shape
  • Standards
  • Technical Information Centers
  • Transmission Electron Microscopy
  • Two Dimensional

Readers

  • Computer Vision.
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene