Trapped Highly Charged Ion Plasmas
Abstract
Electron Beam Ion Trap (EBIT) devices and their special features are reviewed with attention to applications in highly charged ion plasma research. EBIT properties are presented based on information extracted from a variety of experiments reported in the literature. Topics discussed include typical parameters (Debye length, Wigner-Seitz radius, Coulomb coupling parameter. density, temperature, etc.), magnetic trapping mode, ion cloud shape, rotation, and evaporative cooling. We conclude that the quantitative understanding of highly charged ion plasmas inside an EBIT requires improved modeling and advanced diagnostic techniques.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 24, 2002
- Accession Number
- ADP012506
Entities
People
- E. Takacs
- J. D. Gillaspy
Organizations
- National Institute of Standards and Technology