Luminescence from Erbium Oxide Grown on Silicon
Abstract
The luminescence properties of erbium oxide grown on crystalline and amorphous silicon substrates were studied by means of photo- and cathodoluminescence techniques. Differences in the luminescence spectra for samples grown on the two types of substrates used are explained in terms of the different types of erbium centers formed by taking into account the substrate properties and the thermal treatments during growth. For comparison, erbium implanted and oxygen comparison crystalline and amorphous silicon have been also investigated by luminescence techniques. In the implanted samples, the sharp transitions from erbium ions in the visible range were quenched and the main emission corresponds to the intraionic transitions in Er(3+) ions in the infrared range peaked at 1,54 micrometers.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2002
- Accession Number
- ADP012647
Entities
People
- B. Mendez
- Emilio Nogales
- J. A. Garcia
- J. Piqueras
- R. Plugaru
Organizations
- Complutense University of Madrid