Current Images of CdSe Colloidal Nanodots Observed by Conductive-tip Atomic Force Microscopy
Abstract
We have fabricated submonolayer-thick films of CdSe colloidal nanodots in order to investigate electronic properties of individual nanodots by conductive-tip atomic force microscopy (AFM). Topographic and current images of isolated single CdSe colloidal dots on single crystalline Au (111) surface which was covered with dodecanethiol self-assembled monolayer were obtained by AFM operating in contact mode with a conductive tip under appropriate bias voltages. In the current image, it is found that the dot regions have higher electric resistance due to tunneling resistance through the CdSe dots. We also found 10 nm-scale electric inhomogeneity around the dots, which may corresponds to the previously reported etch-pits of Au (III) surfaces formed during the deposition of the dodecanethiol molecules.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2002
- Accession Number
- ADP012649
Entities
People
- Eri Kawasaki
- H. Asami
- Ichiro Tanaka
- M. Hara
- O. Ohtsuki
Organizations
- Wakayama University