Effect of Zn Atom Diffusion in the Active Layer of InGaAlP Visible-LED Investigated by the Piezoelectric Photothermal Spectroscopy
Abstract
It has been reported that Zn atoms diffused from the Zn-doped p-InAlP cladding to the active layer in InGaAlP visible-light-emitting diodes cause a degradation of light output efficiency. A doping effect of the Zn atoms was then investigated using a Piezoelectric Photothermal Spectroscopy from a nonradiative transition point of view. The results indicate that the Zn-doping unexpectedly induces a decrease of the nonradiative component of the electron transitions above the band gap of the active layer. The experimental results are explained by considering that Zn doping cause the increase of both shallow and deep acceptor levels at the same time with the different rate for generation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2002
- Accession Number
- ADP012656
Entities
People
- Atsuhiko Fukuyama
- Ryuji Ohno
- Shoichro Sato
- Tetsuo Ikari
- Yoshihito Taiji
Organizations
- University of Miyazaki