Pulsed Laser Deposition and Characterization of Zn(1-x)Mn(x)O Films

Abstract

Here we present our results of structural, optical, and magnetic measurements of Zn(1-x)Mn(x)O thin films. These films were grown epitaxially on (0001) sapphire substrates by using pulsed laser deposition technique. The maximum Mn content (x = 0.36) is found to be much higher than allowed by thermal equilibrium limit (x-0.13) due to the non-equilibrium nature of the pulsed laser deposition. All the films investigated here were found to be single phase with <0001> orientation epitaxial relationship. A linear increase in the c-axis lattice constant was observed with increase in Mn concentration. Optical transmittance measurements showed an increase in the insulating band-gap (E(sub g)) with increase in Mn concentration. DC magnetization measurements showed that there is no long range ferromagnetic ordering down to 10 K.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2002
Accession Number
ADP012673

Entities

People

  • A. Kvit
  • Aruna Tiwari
  • C. Jin
  • D. Kumar
  • J. Muth

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Advanced Materials
  • Band Gaps
  • Diffraction
  • Electron Microscopy
  • Engineered Materials
  • Engineering
  • Films
  • Magnetic Properties
  • Magnetometers
  • Materials
  • Materials Engineering
  • Materials Processing
  • Materials Science
  • Pulsed Lasers
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Superconducting Magnet Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene