Atomic Force Microscopy of Fullerene-Indopane Monolayers
Abstract
The atomic force microscopy (AFM) is a power tool for various surface objects imaging and characterisation in nanometer scale including surface heterogeneity imaging. The resolution up to several nanometers in the scanned plane can be realised with a sharp enough probing tip while the relief height resolution may be as high as several Angstroms. AFM also enables to make manipulations of nanometer scale with the surface objects. We previously reported on the results of the tunneling electron microscopy study of C60 fullerene monolayer structure formed by Schaefer horizontal lifting from the fullerene-surfactant mixture. In this paper we report on the results of AFM investigations of C60 fullerene-indopane monolayers.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1998
- Accession Number
- ADP012742
Entities
People
- M. D. Eremtchenko
- S. L. Vorob'eva
- V. A. Fedirko
- V. R. Novak
Organizations
- Moscow State University