XPS Study of Cu-Clusters and Atoms in Cu/SiO2 Composite Films

Abstract

The XPS-TEM study of Cu/SiO2 composite metal-insulator films allowed us to develop the diagnostics of the chemical states of metal atoms and the parameters of the ensembles of metal-clusters and metal-atoms which are important for single-electron tunnelling processes.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1998
Accession Number
ADP012830

Entities

People

  • S. A. Gurevich
  • S. G. Konnikov
  • T. A. Zaraiskaya
  • V. M. Mikoushkin
  • Yu S. Gordeev

Organizations

  • Russian Academy of Sciences

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Annealing
  • Auger Electrons
  • Chemical Shifts
  • Composite Materials
  • Copper
  • Copper Compounds
  • Electrical Properties
  • Electrons
  • Elements
  • Films
  • Kinetic Energy
  • Materials
  • Metals
  • Photoelectron Spectra
  • Photoelectrons
  • Spectra
  • X Rays

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene