The Formation of Copper Nanoclusters in SiO2: An X-ray Absorption Study

Abstract

Results on Cu K-edge x-ray absorption study of copper dispersed in SiO2 are reported. Randomly distributed in as-made samples at low concentration, copper atoms tends to form clusters at larger concentrations. The cluster size reaches a size of 20 to 50 A after which the cluster growth stops. Only the first-neighbour peak is observed in as-made samples indicating either a very strong disorder in clusters or their low-dimensionality. Annealing results in the formation of copper clusters of the same size with fcc structure.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1998
Accession Number
ADP012831

Entities

People

  • A. V. Kolobov
  • H. Oyanagi
  • Kōichi Tanaka
  • S. A. Gurevich
  • V. V. Horenko

Organizations

  • Russian Academy of Sciences

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Absorption
  • Composite Materials
  • Curve Fitting
  • Data Analysis
  • Detectors
  • Films
  • Hard Copy
  • Materials
  • Materials Laboratories
  • Nanoparticles
  • Nanostructures
  • Oscillation
  • Scattering
  • Spectra
  • Technical Information Centers
  • Thick Films
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Quantum Chemistry