Noise in Metallic Set Transistors of the Different Contact Area Between their Islands and a Substrate

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1998
Accession Number
ADP012847

Entities

People

  • A. B. Zorin
  • D. E. Presnov
  • H. Scherer
  • M. N. Savvateev
  • V. A. Krupenin

Organizations

  • Moscow State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Buildings And Structures
  • Electrometers
  • Electron Beam Lithography
  • Fabrication
  • Frequency
  • Hard Copy
  • Intensity
  • Lithography
  • Measurement
  • Nanostructures
  • Sensitivity
  • Shot Noise
  • Substrates
  • Technical Information Centers
  • Transistors
  • Tunnels