Epitaxial Growth and Characterization of MnAs/Si(111) Nanoscale Magnetoelectronic Heterostructures

Abstract

Molecular beam epitaxy was used to grow thin (6-12 nm) ferromagnetic MnAs films on a Si(111) substrate. The characterization of the film structural and magnetic properties was carried out using X-ray. RHEED. AFM and magneto-optical methods.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 2000
Accession Number
ADP013032

Entities

People

  • A. A. Rzhevsky
  • A. G. Banshchikov
  • Ahsan M. Nazmul
  • N. S. Sokolov
  • R. V. Pisarev

Organizations

  • Russian Academy of Sciences

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Curie Temperature
  • Diffraction
  • Diffraction Analysis
  • Epitaxial Growth
  • Films
  • Flow
  • Geometry
  • Kerr Effects
  • Magnetic Fields
  • Magnetic Properties
  • Nanostructures
  • Optical Phenomena
  • Optical Properties
  • Thickness
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene