Magnetic Force Microscopy of Fe Nanoparticles Buried into SiO(2)

Abstract

The MFM-images of the array of separately placed a-Fe nanoparticles buried into SiO(2) formed by ion bombardment have been obtained for the first time. The method of the computer analysis of MFM-images with consideration of the shape and magnetic properties of MFM-tip apex has been developed and applied for analyzing of the obtained magnetic images.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 2000
Accession Number
ADP013082

Entities

People

  • A. A. Bukharaev
  • D. V. Ovchinnikov
  • R. Wiesendanger

Organizations

  • Russian Academy of Sciences

Tags

DTIC Thesaurus Topics

  • Computer Programs
  • Computer Simulations
  • Computers
  • Electron Microscopy
  • Ferromagnetic Materials
  • Ion Bombardment
  • Magnetic Dipoles
  • Magnetic Fields
  • Magnetic Forces
  • Magnetic Materials
  • Magnetic Moments
  • Magnetic Properties
  • Microscopes
  • Microscopy
  • Nanoparticles
  • Particles
  • Simulations

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology
  • Structural Dynamics.

Technology Areas

  • Biotechnology