Resonant Second-Harmonic Phase Spectroscopy of the Buried Interfaces of Column IV Semiconductors

Abstract

The second-harmonic interferometric spectroscopy (SHIS) is proposed as a new spectroscopic technique to study the resonant electron response of solid state nanostructures. The combination of the second-harmonic (SH) amplitude and phase spectra is shown to be more sensitive to resonant parameters of the electron density of states in comparison with the conventional SH intensity measurements. The resonant anisotropic SH response of buried oxidized Si(111) and Ge(111) surfaces is studied using SHIS in the vicinity of the E(2) critical points. Both spectra of the phase and amplitude of the SH field with different lineshapes for Si and Ge surfaces are obtained.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 2000
Accession Number
ADP013091

Entities

People

  • A. A. Fedyanin
  • D. Schuhmacher
  • G. Marowsky
  • O. A. Aktsipetrov
  • T. V. Dolgova

Organizations

  • Moscow State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplitude
  • Electron Density
  • Electrons
  • Hard Copy
  • Intensity
  • Intervals
  • Nanostructures
  • Phase
  • Phase Measurement
  • Phase Shift
  • Physics
  • Radiation
  • Resonance
  • Semiconductors
  • Spectra
  • Spectroscopy
  • Technical Information Centers

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
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  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics