Comparison of Hole and Electron Emission from InAs Quantum Dots

Abstract

Carrier escape processes from self-organized InAs quantum dots (QDs) embedded in GaAs are investigated by time-resolved capacitance spectroscopy. Electron emission is found to be dominated by tunneling processes. In addition to tunneling from the ground state, we find thermally activated tunneling involving excited QD states with an activation energy of 82 meV. For boles, the tunnel contribution is negligible and thermal activation from the QD ground state to the GaAs valence band with an activation energy of 164 meV dominates. Extrapolation to room temperature yields an emission time constant of 5 ps for holes, which is an order of magnitude larger than for electrons. The measured activation energies agree well with theoretically predicted QD levels.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 2000
Accession Number
ADP013101

Entities

People

  • C. M. Kapteyn
  • D. Bimberg
  • M. Lion
  • P. N. Brunkov
  • R. Heitz

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Capacitance
  • Conduction Bands
  • Detection
  • Electron Emission
  • Electrons
  • Emission
  • Energy Bands
  • Energy Levels
  • Fermi Levels
  • Ground State
  • Heat Of Activation
  • High Temperature
  • Low Temperature
  • Metal-Semiconductor Junctions
  • Photoexcitation
  • Quantum Dots
  • Valence Bands

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Quantum Chemistry
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Quantum Computing
  • Quantum Science - Quantum Dots