X-ray Diffraction Study of CdSe/BeTe Nanostructures Grown by MBE with Stressor-Controlled Interfaces

Abstract

This report documents a detailed XRD study of the novel type-II CdSe/BeTe nanostructures formed by stressor-assisted self-formation. High sensitivity of the diffraction curves to interface types is revealed. The model developed for a sinmilation of rocking curves includes spontaneous formation of BeSe enriched interface formation when the smaller amount of CdTe FM stressor as compared to that corresponding to a maximum RHEED SSI is intentionally deposited.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP013148

Entities

People

  • P. S. Kop'ev
  • R. N. Kyutt
  • S V Ivanov
  • S. V. Sorokin
  • T. V. Shubina

Organizations

  • Russian Academy of Sciences

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Artificial Satellites
  • Chemical Bonds
  • Chemical Composition
  • Diffraction
  • Electronics
  • Exchange Reactions
  • Hard Copy
  • Intensity
  • Molecular Beams
  • Nanostructures
  • Physics
  • Quantum Dots
  • Simulations
  • Technical Information Centers
  • Thickness
  • X Rays
  • X-Ray Diffraction

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics