Silicon Nanoclusters Embedded in SiO2 Studies by Raman Scattering

Abstract

Low concentration of nanometric sized particles produced by a ball milling procedure were introduced into SiO(2) matrix by the sol-gel method. SiO(2) sol-gel formulations with high water-TEOS ratios were prepared. Samples with high silanol concentration was obtained for high temperatures as was proven by FTIR spectroscopy measurements. Raman scattering measurements showed evidence of a photo-oxidation effect of Si nanoparticles embedded into a SiO(2) matrix. Si particle sizes measured by Raman scattering were in the range from 7 to 14 nm.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2001
Accession Number
ADP013262

Entities

People

  • F. J. Espinoza-beltran
  • F. Rodriguez-melgarejo
  • J. M. Yanez-limon
  • J. Morales-hernandez
  • L. I. Diaz-flores

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ball Mills
  • Chemical Reactions
  • Chemical Vapor Deposition
  • Chemistry
  • Grain Size
  • High Temperature
  • Infrared Spectroscopy
  • Materials
  • Materials Science
  • Measurement
  • Nanoparticles
  • Particles
  • Raman Scattering
  • Raman Spectra
  • Scattering
  • Spectra
  • Spectroscopy

Fields of Study

  • Materials science

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Powder metallurgy of Titanium alloys.
  • Quantum Chemistry

Technology Areas

  • Biotechnology