Microwave Dielectric Spectroscopy of Ferroelectric Thin Films

Abstract

We devised a measurement method of microwave dielectric constants of dielectric thin films without applying electrodes. The method uses a rectangular waveguide in which the dielectric thin films prepared on a substrate are filled vertically at the center. The frequency dependence of S-parameter measured by network analyzer enables us to calculate the dielectric constant and loss factor of the films at the microwave region through simulation. We prepared Ba(0.6)Sr(0.4)TiO3 thin films on (001) MgO single crystal substrate by pulsed laser deposition (PLD), and determined their dielectric constant and loss factor at ^10GHz using this method.

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Document Details

Document Type
Technical Report
Publication Date
Apr 03, 2003
Accession Number
ADP013349

Entities

People

  • Beomjin Kim
  • Minki Jeong
  • Sunggi Baik
  • Victor Kazmirenko
  • Yuri Poplavko

Organizations

  • Pohang University of Science and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Dielectric Permittivity
  • Dielectric Properties
  • Electric Fields
  • Electromagnetic Fields
  • Films
  • Frequency
  • Losses
  • Materials
  • Materials Science
  • Measurement
  • Microwaves
  • Pulsed Lasers
  • Single Crystals
  • Spectroscopy
  • Substrates
  • Technical Information Centers
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Microwave Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition