Studies of Thin Films Ferroelectrics with Charge-Compensated Substitutions in BST

Abstract

Thin films were prepared from bulk targets by pulsed-laser deposition techniques. The targets were composed of Ba(0.6)Sr(0.4)TiO3 with charge-compensated substitutions for Ti(4+). Results of the dielectric characterization measurements will be discussed and compared to the results of similar measurements in bulk materials with the same composition.

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Document Details

Document Type
Technical Report
Publication Date
Apr 03, 2003
Accession Number
ADP013365

Entities

People

  • Arthur Tauber
  • Bernard Rod
  • Daniel M. Potrepka
  • Kevin Kirchner
  • Steven Tidrow

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Bulk Materials
  • Capacitance
  • Dielectric Permittivity
  • Diffraction
  • Diffraction Analysis
  • Electric Fields
  • Electron Beams
  • Electrons
  • Figure Of Merit
  • Films
  • Lasers
  • Materials
  • Measurement
  • Pulsed Lasers
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition