Explanation of the Initial Phase Change vs. Incident Angle of the RHEED Intensity Oscillation

Abstract

Reflection high-energy electron diffraction (RHEED), which is a very widely used monitoring technique of molecular-beam-epitaxial growth processes, still has some unexplained features. An interesting example of these, the so-called t(3/2)/T phenomenon, is investigated in this paper. The first period of the intensity oscillations of RHEED shows a singular behavior. An interpretation for the initial change of the phase and of the period duration dependence on the incident angle of the electron beam using the notion of surface coherence length is given here. This particular phenomenon is satisfactorily explained in the case of a Gallium Arsenide (GaAs) (001) surface. (4 figures, 12 refs.)

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Document Details

Document Type
Technical Report
Publication Date
Jun 03, 2002
Accession Number
ADP013780

Entities

People

  • Akos Nemcsics

Organizations

  • Hungarian Academy of Sciences

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Computer Simulations
  • Crystal Growth
  • Diffraction
  • Electron Beams
  • Electron Diffraction
  • Electron Energy
  • Electrons
  • Energy
  • Epitaxial Growth
  • Films
  • High Energy
  • Intensity
  • Materials
  • Materials Science
  • Phase Shift
  • Physics
  • Subatomic Particles

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Munitions and Ordnance Engineering
  • Theoretical Analysis.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene