Dielectric Parameters Recognition by Using a Waveguide Cavity and a Rigorous Processing Algorithm

Abstract

Measurement of scattered electromagnetic field and further permittivity or permeability reconstruction based on experimental data and adequate mathematical model is the key issue in dielectric materials study 1,2. Here accuracy of measurements and adequacy of mathematical model is of principal importance. Today special attention is attracted to the study of thin dielectric films with tg (delta)^10(exp -3) /10(exp -6). In this paper we consider a resonator that can be used for a thin film study its electromagnetic model, and advantages and capacities of corresponding numerical algorithm.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 2002
Accession Number
ADP013926

Entities

People

  • Anatoliy A. Kirilenko
  • Anatoliy Y. Poyedinchuk
  • Nataliya P. Yashina

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Algorithms
  • Amplitude
  • Dielectric Films
  • Dielectric Permittivity
  • Dielectrics
  • Electromagnetic Fields
  • Electromagnetism
  • Electronic Mail
  • Errors
  • Films
  • Frequency
  • Inverse Problems
  • Mathematical Models
  • Models
  • Technical Information Centers
  • Thin Films

Readers

  • Computational Modeling and Simulation
  • Nanofabrication and Microfabrication.
  • Optical Physics and Photonics.