Interfacial Control of Creep Deformation in Ultrafine Lamellar TiA1
Abstract
Solute effect on the creep resistance of two-phase lamellar TiAl with an ultrafine microstructure creep- deformed in a low-stress (LS) creep regime WHERE A NEARLY LINEAR CREEP BEHAVIOR WAS OBSERVED has been investigated. The resulted deformation substructure and in-situ TEM experiment reveals that interface sliding by the motion of preexisting interfacial dislocations is the predominant deformation mechanism in LS creep regime. Solute segregation at interfaces and interfacial precipitation caused by the segregation result in an increase of creep resistance in LS creep regime.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2003
- Accession Number
- ADP014280
Entities
People
- L. M. Hsiung
Organizations
- Lawrence Livermore National Laboratory