Electro-Thermal Scaling Properties of Electron Devices: A Multi-Scale Monte Carlo Approach
Abstract
The research will be divided into separate thrusts to be integrated at the conclusion of the effort. Two thrusts extend the CMC modeling capabilities on the opposite end of the simulation space: the microscopic interactions between charge carriers (electrons) and heat carriers (phonons). The CAD tool will be used to simulate critical experiments and phonon engineered device concepts that can be validated through experiments to show that the internal energy paths of an RF device can be manipulated to increase performance as a design parameter.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Nov 29, 2016
- Source ID
- FA86501517525
Entities
People
- John D. Albrecht
Organizations
- Air Force Research Laboratory
- Defense Advanced Research Projects Agency
- Michigan State University