Reliability Physics of Advanced Space Electronics
Abstract
The primary purpose of this fundamental study will be to enrich the physics of failure-based rate and wearout models for high power and advanced electronics and include solder and connections in the reliability models. Results will be calibrated with testing, analysis of the resulting data and failure analyses on devices in an effort to maintain the wearout and failure rate prediction arising from developed models. Specific objectives are: 1. Develop models with scaling parameters linked to key semiconductor device attributes that can impact space based electronic system design and recommend methods to manage their reliability 2. Utilize the physics of failure models to guide accelerated reliability testing of selected semiconductor devices, specifically the Xilinx 28nm FPGA development board. 3. Collaborate with partners for failure analysis to verify the multiple failure modes assertion, and complete existing analysis of components and extend the technique to 40 nm, 28nm and more advanced components as they become available
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Mar 23, 2016
- Source ID
- FA95501510165
Entities
People
- Joseph Bernstein
Organizations
- Air Force Office of Scientific Research
- Ariel University
- United States Air Force