DURIP in Support of Physical Mechanisms Impacting Reliability in Emerging Technologies
Abstract
The objective is to develop, via experimentation and theory, knowledge and tools that will guide development of future radiation-hardened electronics. Instrumentation will be purchased to produce a one-of-a-kind test capability for evaluation of radiation effects on advanced microelectronics. The focus will be on enabling evaluation of single event effects.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Mar 23, 2016
- Source ID
- FA95501510405
Entities
People
- Robert Reed
Organizations
- Air Force Office of Scientific Research
- United States Air Force
- Vanderbilt University