Instrumentation for Vacuum Nano-Electronic Devices High Current & Long Life Cathodes/Ion Sources

Abstract

Build a Scanning Anode Field Emission Microscope (SAFEM) for research on vacuum nano-electronics (VNE) devices intended for application to RF, IR, Deep UV, ion and neutron sources.

Document Details

• Document Type: DoD Grant Award
• Publication Date: Jul 15, 2016
• Source ID: FA95501610244

Entities

People

• Akintunde Akinwande

Organizations

• Air Force Office of Scientific Research
• Harvard University
• United States Air Force

Tags

Fields of Study

• Physics

Readers

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Technology Areas

• Microelectronics