Broadband Scanning Microwave Microscopy of Phosphorene
Abstract
We propose to develop broadband scanning microwave microscopy (SMM) for characterization of the structure and properties of phosphorene, in collaboration with the group of Dr. James Hwang of Lehigh University, Bethlehem, Pennsylvania, who is currently funded for phosphorene research by AFOSR via NSF Grant No. 1433459-EFMA. Phosphorene is a promising two-dimensional atomic layer material which has high mobility like graphene, but wide bandgap like molybdenum disulfide. SMM allows nanoscale mapping of electromagnetic properties (e.g., electrical conductivity, carrier mobility, dielectric constant) in a non-contacting and non-invasive mode. Compared to other non-contacting techniques such as optical, X-ray or electron microscopy, SMM is highly noninvasive because the energy of microwave photons is only on the order of 10 ?eV, which is too weak to damage phosphorene. Compared to other nanoscale techniques such as atomic force microscopy and scanning tunneling microscopy, SMM has a unique capacity to probe buried and optically opaque structures down to the micron depth, which is critical for probing phosphorene through a passivation layer necessary to protect the reactive surface of phosphorene.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Apr 09, 2018
- Source ID
- FA95501710043
Entities
People
- Marco Farina
Organizations
- Air Force Office of Scientific Research
- Polytechnic University of the Marches
- United States Air Force