Benchtop SEM/TEM unit for the characterization of 3D printed structures
Abstract
Acquisition of a bench-top electron microscope is proposed. It will be used to carry out rapid micro-characterization analysis on structures constructed through additive manufacturing. Over the last three years, the proposer and his university have been actively involved in research, development, and growth of additive manufacturing, and has recently created the Center for Innovation in Additive Manufacturing (CIAM). The CIAM currently houses several 3-D printed equipment and technologies such as Binder Jetting, Direct Energy Deposition, Fused Deposition Modeling, among several others, which are used to manufacture structures based on plastics, ceramics, or metals.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Sep 11, 2017
- Source ID
- FA95501710385
Entities
People
- Pedro Cortes
Organizations
- Air Force Office of Scientific Research
- United States Air Force
- Youngstown State University