PULSED-LASER-BASED RADIATION EFFECTS CHARACTERIZATION SYSTEM FOR MILLIMETER-WAVE/TERAHERTZ MATERIALS AND DEVICES
Abstract
The key mechanisms of performance degradation in extreme-environment applications are radiation effects, and constituent electronics require radiation hardening for their robust operation. With a regard to radiation effects, dynamic interference such as data loss or signal-to- noise degradation is mainly due to single-event effects (SEE), which occur when a high-energy particle collides with an active device region, producing excess carriers. One of the methods of testing SEE on semiconductor devices is by means of picosecond and femtosecond lasers. SEE testing with ultrafast lasers can be done in single- or two-photon absorption methods (SPA and TPA). The benefit of laser-induced SEE, however, is that temporal and spatial information about the charge bundle is measurable, as opposed to bundles produced by random ions in typical particle accelerators.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 12, 2021
- Source ID
- FA95502010234
Entities
People
- Ickhyun Song
Organizations
- Air Force Office of Scientific Research
- Oklahoma State University–Stillwater
- United States Air Force