EVALUATING HIGH RESOLUTION IN VIVO PROTON IMAGING AT NANOSCALE AIMING TO SET UP LIQUID CELL PROTON MICROSCOPY
Abstract
Microscopy has been an integral part of scientific development. Miniaturization has spurred further development in many fields. But currently optical microscopy is limited by the diffraction effect due to the wavelength of light. Charged particle beams are promising probes to obtain nanoscale resolution attributing to the practical absence of diffraction effect.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 12, 2021
- Source ID
- FA95502010249
Entities
People
- Jeroen Van Kan
Organizations
- Air Force Office of Scientific Research
- National University of Singapore
- United States Air Force