Photonic Integrated Circuit Test and Characterization System
Abstract
The proposed effort will provide a stand-alone capability for the testing and characterization of photonic-integrated-circuits (PICs) manufactured through the AIM Photonics Institute and a particular emphasis on heterogeneously integrated silicon photonics materials and devices that offer enhanced electro-optic materials, such as Lithium-Niobate. This work is motivated, in part, by the perpetual demand for high-frequency and high-bandwidth communications systems that is being driven by the Federal Communications Commission (FCC) who recently opened spectral windows in the microwave and millimeter wave spectrums, in particular 28-29 GHz, 39-40 GHz, and 64-71 GHz. The realization of this system will include the integration of many individual components in order to create a PIC test station that is capable of characterizing device performance up to 67 GHz including capabilities specifically suited for characterization of analog RF Photonic device performance for beamforming applications targeted by the phased array communication system. This station will require a variety of standard test equipment, including but not limited to: PSG Analog Signal Generator, digital oscilloscope, tunable laser source, RF power sensor, hexapods and hexapod controllers for device alignment, InGaAs IR camera with log response, computer for interfacing the various equipment, etc. The development of a photonically integrated circuit test station that can characterize analog RF Photonic devices up to 67 GHz will provide a unique capability to further the research into high-frequency high-bandwidth phased array communication systems for the Air Force and the DoD at large.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 12, 2021
- Source ID
- FA95502010331
Entities
People
- Dennis W. Prather
Organizations
- Air Force Office of Scientific Research
- United States Air Force
- University of Delaware