High Resolution X-ray Diffractometer for Research in Epitaxial Materials
Abstract
High resolution x-ray diffractometer can enable multitude of x-ray characterization techniques such as rocking curves, pole figure measurement, reciprocal space maps, x-ray reflectivity and gracing incidence x-ray diffraction, and these techniques can offer wealth of information about lattice constants, strain, composition, mosaicity and dislocations. Such a capability in conjunction with capabilities of Gallium Oxide metal organic chemical vapor epitaxial (MOVPE) growth at the University of Utah, will create invaluable opportunity to advance multiple areas of research related to DoD needs in epitaxial materials with high critical field strength as well as for the training of graduate students in these research areas. In particular, this tool will significantly enhance the pace of work and positively impact the ongoing AFOSR-funded Utah-Washington State Multidisciplinary University Research Initiative (MURI) project on doping and defects in Gallium Oxide by enabling rapid and accurate characterization of homoepitaxial and heteroepitaxial ultra-wide band gap Gallium Oxide thin films and heterostructures. In addition to the MURI project the proposed acquisition will tremendously benefit active AFOSR grant on organic-inorganic hybrid materials at Utah and several ongoing university-funded and seed grant program activities on quantum materials, that are of interest to the Department of Defense. We have also identified several internal and external users from a wide range of disciplines who have expressed interest in this DURIP proposal and intend to use the instrumentation extensively if this DURIP proposal is funded.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Mar 07, 2023
- Source ID
- FA95502110293
Entities
People
- Michael A. Scarpulla
Organizations
- Air Force Office of Scientific Research
- United States Air Force
- University of Utah