NOVEL MEASUREMENT TECHNIQUES FOR THE RAPID CHARACTERIZATION AND ACCURATE MODELING OF DYNAMIC TRAP ACTIVITIES IN ULTRA-WIDE BAND GAP SEMICONDUCTOR DEVICES
Abstract
Investigations using a newly developed pulsed real-time nonlinear vector network analyzer (NVNA) combined with pulsed-IV measurements are proposed to interrogate GaN HEMTs in unprecedented ways and comprehensively characterize cyclostationary trapping in these devices. The novel proposed measurements will be used to develop a more accurate physics-based device model accounting for dynamic trapping processes in support of communication and radar circuitry.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Apr 20, 2023
- Source ID
- FA95502210232
Entities
People
- Patrick Roblin
Organizations
- Air Force Office of Scientific Research
- Ohio State University
- United States Air Force