Evaluating and fingerprinting spintronic materials performance using a single spin sensor
Abstract
Understanding electrical current flow in micro- and nano-electronic devices is essential to help identify and address limitations and performance in beyond-complimentary-metal-oxide-semiconductor (beyond-CMOS) microelectronics technologies. For example, this information can be utilized to optimize new device architectures, emerging material platforms, and thermal management strategies, resulting in devices with increased functionality, new properties, reliability, and reduced power consumption. One promising alternative to beyond-CMOS microelectronics computing and memory devices is to encode and process information using the electron s spin.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Feb 06, 2025
- Source ID
- FA95502410169
Entities
People
- Lucas Caretta
Organizations
- Air Force Office of Scientific Research
- Office of the Secretary of Defense
- Regents of the University of Minnesota