Identification of Morphological and Oxygen Isotopic Signatures in Uranium Oxides

Abstract

Oxygen ratios from meteoric water are incorporated in uranium materials during synthesis, and oxidation and hydration during storage under temperature and relative humidity. We propose to investigate the oxygen isotope ratio as a signature for identification of provenance and process history of uranium materials used in the production of nuclear weapons. The utility of oxygen isotope ratios for assessing process history cannot be realized without a fundamental understanding of how O-atoms are incorporated in U materials and what role microstructural signatures may have in these reactions. Thus, we will evaluate the rate of incorporating mixed oxygen isotopes in high purity U-oxides to simulate oxygen isotope ratio changes within a sample following relocation to a new geographical region. To accurately monitor temporal changes in the oxygen isotope ratios, an oxygen isotope standard will be developed to calibrate measurements using of state-of-the-art instrumentation. Oxygen isotope ratios will be measured using a high vacuum fluorination system (HVFS) with isotope ratio mass spectrometry (IRMS) and basic measurements will be conducted using secondary ion mass spectrometry (SIMS). The physiochemical signatures and changes in microstructure will be monitored using high-resolution scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The proposed fundamental science in an academic setting coupled with technical guidance and resources from Los Alamos National Laboratory (LANL) will instruct and inform the next generation of nuclear scientists and engineers.

Document Details

Document Type
DoD Grant Award
Publication Date
May 26, 2016
Source ID
HDTRA11610026

Entities

People

  • Luther McDonald

Organizations

  • Defense Threat Reduction Agency
  • University of Utah

Tags

Readers

  • Aquatic Ecology
  • Pulsed Power and Plasma Physics.
  • Sensor Fusion and Tracking Systems.

Technology Areas

  • Microelectronics