Radiation Effects in Nanoscale Electromechanical Logic Devices and Pathways Toward Robust Computing in Extreme Environment
Abstract
Through a multidisciplinary collaboration, we aim at discovering fundamental effects of NEMS logic devices due to exposure to radiation sources representative of space and nuclear environments, and attaining comprehensive, in-depth understandings of how these radiations affect NEMS logic performance (e.g., including off-state leakage, on-current, on-voltage, switching speed, etc.), surface and nanocontact properties, reliability and lifetime, etc. By exploring fundamentals and revealing new knowledge in these aspects, this project and its success shall offer guidelines and pathways to allow us to design future NEMS logic devices, and to innovate other disruptive low-power computing devices and paradigms that may be adaptive or entirely resistant to specific radiation, ionizing stimuli, etc., in extreme environments.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Dec 03, 2019
- Source ID
- HDTRA11910035
Entities
People
- Philip X-L Feng
Organizations
- Defense Threat Reduction Agency
- University of Florida