Real-Time Degradation Monitoring of Wide Bandgap Power Devices and Power Conversion Systems
Abstract
This proposal aims to investigate incipient faults of wide band-gap (WBG) semiconductor devices and create online fault diagnosis / failure prognosis tools to establish early warning system for future power electronics (PE) systems. Enabled by foundational WBG technologies, these systems are undergoing a radical transformation in structure and key components. The superior features of GaN and SiC devices over silicon (Si) based counterparts are poised to revolutionize electric vehicles, grid-integration and military systems. The rapid and widespread deployment of WBG semiconductors raises significant reliability concerns, particularly for mission and safety critical systems due to limited field data and potential uncertainties. Continuously monitoring these systems is essential to prevent unexpected shutdowns and catastrophic failures that may result in fatal accidents or significant operation loss. However, current diagnostic engineering tools are not mature enough to detect or identify failure precursors in real time, leading to a major reliability gap in WBG-based power conversion systems. In order to move WBG technologies forward reliably, this proposal investigates progressive degradations and parameter shifts in WBG devices as well as develops online degradation monitoring tools using readily available system components.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 12, 2016
- Source ID
- N000141512325
Entities
People
- Bilal Akin
Organizations
- Office of Naval Research
- United States Navy
- University of Texas at Dallas