Broadband Characterization Test-set for Low Temperature Integrated Circuits

Abstract

Abstract Achieving cutting-­?edge performance for current and future applications will always require the use of cryogenically cooled electronics. Today, there is a need for complex cryogenic integrated circuits and, at the University of Massachusetts Amherst, we are currently exploring a variety of research in the area of cryogenic circuit and system design. We request funding from the DoD to acquire a broadband superconductor/semiconductor characterization test-­?set including (1) a closed-­? cycle 4 K cryogenic test-­?bed with dual inserts, (2) a 1-­?12.5Gbps/22-­?44Gbps BER Tester, (3) a 65 Gsps four-­?channel AWG, (4) high-­?speed room temperature and cryogenic digitizers, and (5) a programmable 48 channel current-­?bias system. By funding the purchase of this system, the DoD will greatly enhance our research capabilities by providing measurement tools with the required sensitivity to verify higher performance systems, thus enabling the pursuit of more aggressive design targets. We currently have multiple DoD funded programs that will immediately benefit from the proposed equipment. These programs include an ONR funded STTR in which we are working on a novel thermally distributed 4 K to 300 K data link, a second ONR funded research program in which we are studying the fundamental limitations of semiconductor technology for low-­?noise linear amplification in extremely broadband cryogenic applications, as well as a Raytheon funded program in which we are exploring novel techniques for in-­?situ linearity characterization of EW front-­?ends. The proposed equipment will also be highly beneficial to synergistic programs funded by NASA and through an NSF CAREER program, where we are developing integrated circuits to interface with superconducting nanowire single photon detectors. Finally, the area of cryogenic semiconductor electronics is one of increasing importance but comparatively few experts. Acquisition of the proposed system will enable Professor Bardin to more fully disseminate his knowledge in this area to a larger body of students.

Document Details

Document Type
DoD Grant Award
Publication Date
Aug 12, 2016
Source ID
N000141512856

Entities

People

  • Joseph Bardin

Organizations

  • Office of Naval Research
  • United States Navy
  • University of Massachusetts

Tags

Readers

  • Integrated Circuit Design and Technology.
  • Research Science/Academic Research
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics