Determining the Binding Mechanisms of Nitro-Group Containing Explosives on Metal-Oxide Semiconductor Surfaces
Abstract
This project will use nonlinear laser spectroscopic surface analysis techniques to study how nitro-group containing explosives (e.g., TNT, RDX, HMX, PETN) bind to metal oxide semiconductor (MOS) surfaces in the presence of atmospheric water vapor, oxygen, and environmental contaminants. This information can be used to understand which MOS materials would lead to solid-state trace explosive vapor detectors that have low enough detection limits and fast enough response times to be useful for tactical applications.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 12, 2016
- Source ID
- N000141612643
Entities
People
- William E. Asher
Organizations
- Office of Naval Research
- United States Navy
- University of Washington